Template Matching via Search History Driven Genetic Algorithm

Takumi Nakane, Takuya Akashi, Chao Zhang*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Pixel-based template matching suffers from computational cost by increasing potential solutions. Genetic algorithms has been adopted to search hopeful solutions, whereas there is a demand for more accurate matching. In this paper, we propose to employ a modified real-coded genetic algorithm to solve the template matching problem. Specifically, individuals sampled during the exploration process are stored in an archive and spatially clustered in the search space. An enhanced crossover (abbreviated as SHX) exploits the extra cluster information to generate new individuals in more promising regions. To solve the matching problem, this algorithm searches for suitable geometric parameters using a pixel-level dense similarity measure. Experimental results show the effectiveness of SHX for solving the template matching problem.

Original languageEnglish
Title of host publicationInternational Workshop on Advanced Imaging Technology, IWAIT 2022
EditorsMasayuki Nakajima, Shogo Muramatsu, Jae-Gon Kim, Jing-Ming Guo, Qian Kemao
PublisherSPIE
ISBN (Electronic)9781510653313
DOIs
StatePublished - 2022
Event2022 International Workshop on Advanced Imaging Technology, IWAIT 2022 - Hong Kong, China
Duration: 2022/01/042022/01/06

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12177
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference2022 International Workshop on Advanced Imaging Technology, IWAIT 2022
Country/TerritoryChina
CityHong Kong
Period2022/01/042022/01/06

Keywords

  • Genetic algorithm
  • Search history
  • Template matching

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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