Keyphrases
Buffer Layer
100%
PbTiO3
100%
CVD Method
100%
PbZrO3
100%
PZT Thin Films
66%
Compositional Gradient
66%
X Ray Diffraction
33%
Composition Ratio
33%
Stress Relaxation
33%
SrTiO3 Substrate
33%
Epitaxially Grown
33%
SrTiO3
33%
Time Ratio
33%
Valve Opening
33%
Si (100) Substrate
33%
Opening Time
33%
Depth Profile Analysis
33%
Nb-doped SrTiO3
33%
XPS Depth Profile
33%
Material Science
Thin Films
100%
Chemical Vapor Deposition
100%
Buffer Layer
100%
Film
66%
Phase Composition
66%
X-Ray Diffraction
33%
Stress Relaxation
33%
Engineering
Chemical Vapor Deposition
100%
Buffer Layer
100%
Thin Films
100%
Phase Composition
66%
Ray Diffraction
33%
Depth Profile
33%
Stress Relaxation
33%
Agricultural and Biological Sciences