Delocalization of the f electron in CexLa1-xRu 2Si2

Yuji Matsumoto; Noriaki Kimura; Haruyoshi Aoki; Motoi Kimata; Taichi Terashima; Shinya Uji; Tetsuo Okane; Hiroshi Yamagami

doi:10.1143/JPSJ.79.083706

Delocalization of the f electron in Ce_xLa_1-xRu ₂Si₂

Yuji Matsumoto^*, Noriaki Kimura, Haruyoshi Aoki, Motoi Kimata, Taichi Terashima, Shinya Uji, Tetsuo Okane, Hiroshi Yamagami

^*Corresponding author for this work

Department of Physics

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

We have preformed the de Haas-van Alphen effect measurements in Ce _xLa_1-xRu₂Si₂ with magnetic fields in the (001) plane. All the oscillations corresponding to those in LaRu2Si2 can be observed in low Ce concentration samples and the evolution of the Fermi surface properties with x is found to depend strongly on the Fermi surface sheet. We show that the evolution can be attributed to anisotropic hybridization of the f electron with conduction electrons and resultant delocalization of the f electron.

Original language	English
Article number	083706
Journal	Journal of the Physical Society of Japan
Volume	79
Issue number	8
DOIs	https://doi.org/10.1143/JPSJ.79.083706
State	Published - 2010/08

Keywords

CeLaRuSi
Delocalize
Dhva effect
Kondo effect
Strong correlation
f electron

ASJC Scopus subject areas

General Physics and Astronomy

Access to Document

10.1143/JPSJ.79.083706

Cite this

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title = "Delocalization of the f electron in CexLa1-xRu 2Si2",

abstract = "We have preformed the de Haas-van Alphen effect measurements in Ce xLa1-xRu2Si2 with magnetic fields in the (001) plane. All the oscillations corresponding to those in LaRu2Si2 can be observed in low Ce concentration samples and the evolution of the Fermi surface properties with x is found to depend strongly on the Fermi surface sheet. We show that the evolution can be attributed to anisotropic hybridization of the f electron with conduction electrons and resultant delocalization of the f electron.",

keywords = "CeLaRuSi, Delocalize, Dhva effect, Kondo effect, Strong correlation, f electron",

author = "Yuji Matsumoto and Noriaki Kimura and Haruyoshi Aoki and Motoi Kimata and Taichi Terashima and Shinya Uji and Tetsuo Okane and Hiroshi Yamagami",

year = "2010",

month = aug,

doi = "10.1143/JPSJ.79.083706",

language = "英語",

volume = "79",

journal = "Journal of the Physical Society of Japan",

issn = "0031-9015",

publisher = "The Physical Society of Japan",

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TY - JOUR

T1 - Delocalization of the f electron in CexLa1-xRu 2Si2

AU - Matsumoto, Yuji

AU - Kimura, Noriaki

AU - Aoki, Haruyoshi

AU - Kimata, Motoi

AU - Terashima, Taichi

AU - Uji, Shinya

AU - Okane, Tetsuo

AU - Yamagami, Hiroshi

PY - 2010/8

Y1 - 2010/8

N2 - We have preformed the de Haas-van Alphen effect measurements in Ce xLa1-xRu2Si2 with magnetic fields in the (001) plane. All the oscillations corresponding to those in LaRu2Si2 can be observed in low Ce concentration samples and the evolution of the Fermi surface properties with x is found to depend strongly on the Fermi surface sheet. We show that the evolution can be attributed to anisotropic hybridization of the f electron with conduction electrons and resultant delocalization of the f electron.

AB - We have preformed the de Haas-van Alphen effect measurements in Ce xLa1-xRu2Si2 with magnetic fields in the (001) plane. All the oscillations corresponding to those in LaRu2Si2 can be observed in low Ce concentration samples and the evolution of the Fermi surface properties with x is found to depend strongly on the Fermi surface sheet. We show that the evolution can be attributed to anisotropic hybridization of the f electron with conduction electrons and resultant delocalization of the f electron.

KW - CeLaRuSi

KW - Delocalize

KW - Dhva effect

KW - Kondo effect

KW - Strong correlation

KW - f electron

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U2 - 10.1143/JPSJ.79.083706

DO - 10.1143/JPSJ.79.083706

M3 - 学術論文

AN - SCOPUS:77956422826

SN - 0031-9015

VL - 79

JO - Journal of the Physical Society of Japan

JF - Journal of the Physical Society of Japan

IS - 8

M1 - 083706

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