Characterization of ferroelectric property of c-axis and non-c-axis oriented epitaxially grown bismuth layer-structured ferroelectric thin films with different m-numbers prepared by MOCVD

Takayuki Watanabe*, Tomohiro Sakai, Atsushi Saiki, Keisuke Saito, Toyohiko Chikyo, Hiroshi Funakubo

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

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Material Science