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Characterization of defect type and dislocation density in double oxide heteroepitaxial CeO2/YSZ/Si(001) films
C. H. Chen*, T. Kiguchi, A. Saiki, N. Wakiya, K. Shinozaki, N. Mizutani
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
12
Scopus
citations